Atomic Force Microscopy (AFM) and Raman Spectroscopy


Atomic Force Microscopy and Raman Spectroscopy service

Atomic Force Microscopy is dedicated to the characterization of sample surfaces by making topographic three-dimensional analyses of surfaces as well as local mapping of physical quantities.

Raman spectroscopy is used to characterize the molecular composition and structure of a material.

The atomic force microscopy and Raman spectroscopy service is available to LCC researchers and students but also open to all university and private laboratories.

  Service members


Atomic Force Microscope SMART SPM1000-AIST-NT


It is equipped with a high-quality microscope (10X, 50X and 100X objectives) coupled to a high sensitivity spectrograph. The spectral range extends from 100 to 4000 cm-1.

It is also equipped with an air-cooled CCD detector and three laser sources 532, 638 and 785nm with a beam quality optimized for micrometric resolution.

Temperature measurements are possible between 78K and 600K thanks to a cryostat (Linkam scientific).

The AFM microscope can be coupled to this equipment for co-localized Raman analysis.


Contact us
Marine Tassé : (Office B019-LCC)
Phone : 05 61 33 31 5205 61 33 32 15


Laboratoire de chimie de coordination du CNRS

205 route de Narbonne, BP 44099
31077 Toulouse cedex 4

+ 33 5 61 33 31 00